Optical constants and parameters of Urbach absorption edge for x-ray irradiated (Ga0.3In0.7)2Se3 films

I.P. Studenyak, М.М. Поп, Mladen Kranjcec, Andriy M. Solomon, Nataliia V. Titova, Elena Sorochan, Paweł Komada, Indira Shedreyeva, G. Karnakova

2021

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DOI 10.1117/12.2607827

Data confidence 70 medium

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Abstract

(Ga0.3In0.7)2Se3 films were deposited by the thermal evaporation technique. As-deposited (Ga0.3In0.7)2Se3 films were irradiated using wideband radiation of Cu-anode X-ray tube at different exposure times. The spectral dependences of refractive index and extinction coefficient were measured by the spectral ellipsometry technique. The optical transmission spectra of X-ray irradiated (Ga0.3In0.7)2Se3 films were studied depending on irradiation time. Parameters of Urbach absorption edge for X-ray irradiated (Ga0.3In0.7)2Se3 thin films were determined and compared with nonirradiated film. The spectral dependences of refractive indices of non-irradiated and X-ray irradiated (Ga0.3In0.7)2Se3 films are described in the framework of Wemple and DiDomenico model. TThe variation of the parameters of Wemple and DiDomenico model for non-irradiated and X-ray irradiated (Ga0.3In0.7)2Se3 films was discussed.