On nanoheteromorphous structure in amorphous As2S3 films prepared by different methods

2010

Closed access Metadata (CSL-JSON)
DOI 10.1002/pssc.200982738
Data confidence 70 medium
How this score is calculated

It is built from checkable properties of the record itself: whether the article has a DOI, how many independent sources confirmed its data, whether the required fields are filled in, and how recent the latest confirmation is. Disagreement between sources and a missing identifier lower it. A value of 80 or above means the record was published without further checking; 60 to 79 means it is published at reduced confidence, with a manual check advisable. A record verified by an editor by hand is never pushed below 90 by a recalculation. This scores our data about the article, not the article itself.

Abstract

Abstract By the method of Raman spectroscopy as well as the methods of thermo‐gravimetric and differentially‐thermal analyses the structure of amorphous As2S3 films prepared by thermal evaporation in a vacuum and by radio frequency ion‐plasma sputtering has been studied. The techniques are strongly differing in the conditions of substance vaporization and condensation of atoms on a substrate. It was shown that the concept of nanoheteromorphism can be used to the description of these amorphous films structure. (© 2010 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)