Abstract
In-circuit (ICT) and in-board (IBT) testers are commonly used in industrial environments to support electronics manufacturing. Each of these performs a parametric measurement that checks the voltage values at each measured point and compares them to a value in a database. These devices perform measurements based on the method of nodal potentials.The fact that the measured values can be set, parameterized and programmed makes them very convenient to use, making them ideal for performing a fault detection and analysis measurement in support of production. Programming the equipment requires a high level of expertise and knowledge of electronic circuits. To replace these measuring and testing devices, we provide in this article a recommendation, a cost-effective solution.