Abstract
A semi-analytical method is suggested for solving inverse problems of recovering the relative permittivity profile of inhomogeneous anisotropic layers from frequency dependences of the reflection factor of plane monochromatic electromagnetic waves. The method proceeds from the idea of reducing the initial inverse problem to the optimal control problem for the Riccati equation. The procedure of constructing the solution of this problem is based on the use of the semi-analytical method of solving direct problems of monochromatic plane wave diffraction by an inhomogeneous layer and a suggested algorithm of calculating the gradient of the smoothing discrepancy functional. The developed algorithms of solving the direct and inverse problems of wave diffraction by inhomogeneous layers are used to perform a set of numerical experiments in order to demonstrate efficiency of the suggested technique for indirect recovering parameters of structures of the kind.