A Multichannel Detector for Monitoring the Degradation of Scintillation and Semiconductor Detectors in Low-Intensity Heavy-Ion Beams

Yu. G. Teterev, A. I. Krylov, A. T. Issatov, Semen V. Mitrofanov

2020

Closed access Metadata (CSL-JSON)
DOI 10.1134/s0020441220030057
Data confidence 70 medium
How this score is calculated

It is built from checkable properties of the record itself: whether the article has a DOI, how many independent sources confirmed its data, whether the required fields are filled in, and how recent the latest confirmation is. Disagreement between sources and a missing identifier lower it. A value of 80 or above means the record was published without further checking; 60 to 79 means it is published at reduced confidence, with a manual check advisable. A record verified by an editor by hand is never pushed below 90 by a recalculation. This scores our data about the article, not the article itself.

Abstract

Abstract— The description of detectors based on measuring the secondary-emission current and results of their tests are presented. Multichannel profilometers with a range of n × 103 to 109 ions/(cm2 s) have been created. This range is largely overlapped with the range from a few units to 106 ions/(cm2 s), which is characteristic of scintillation and semiconductor detectors. Current profilometers are used in the region of the overlap to monitor their degradation under exposure to the beam. The current profilometers are used in the transit of low-intensity beams, and their sensitivity is higher than the sensitivity of Al2O3 phosphors and Faraday cups by four orders of magnitude. A three-lamel probe has been created based on the secondary emission to measure the current of the internal accelerator beam with a lower-range value of 0.1 pA.