Аннотация
Abstract— The description of detectors based on measuring the secondary-emission current and results of their tests are presented. Multichannel profilometers with a range of n × 103 to 109 ions/(cm2 s) have been created. This range is largely overlapped with the range from a few units to 106 ions/(cm2 s), which is characteristic of scintillation and semiconductor detectors. Current profilometers are used in the region of the overlap to monitor their degradation under exposure to the beam. The current profilometers are used in the transit of low-intensity beams, and their sensitivity is higher than the sensitivity of Al2O3 phosphors and Faraday cups by four orders of magnitude. A three-lamel probe has been created based on the secondary emission to measure the current of the internal accelerator beam with a lower-range value of 0.1 pA.