Characteristics of Secondary Electrons Ejected from Solid Targets by Multiply Charged Ions with Energy up to 20 MeV/Nucleon

1981

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DOI 10.1002/pssb.2221050203
Data confidence 70 medium
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Abstract

Abstract Detailed characteristics of secondary electron emission from silicon after bombardment by multiply charged ions Al, C, O, Ca, Si, Fe with energies up to 20 MeV/nucleon are deduced from Monte‐Carlo simulations. The calculated integral yields η in forward direction to approach the η—Zeff law. The discrepancies between calculated and experimental data for fission fragments are discussed. Limits for ion charge resolution by secondary particle counting are obtained.