Exploring Support Vector Regression for Modeling of GaN HEMT

2018

Closed access Metadata (CSL-JSON)
DOI 10.1109/imarc.2018.8877341
Data confidence 70 medium
How this score is calculated

It is built from checkable properties of the record itself: whether the article has a DOI, how many independent sources confirmed its data, whether the required fields are filled in, and how recent the latest confirmation is. Disagreement between sources and a missing identifier lower it. A value of 80 or above means the record was published without further checking; 60 to 79 means it is published at reduced confidence, with a manual check advisable. A record verified by an editor by hand is never pushed below 90 by a recalculation. This scores our data about the article, not the article itself.

Abstract

This paper, for the first time, presents a support vector regression (SVR) based small signal modelling approach for a GaN High Electron Mobility Transistor (HEMT). It makes use of the nonlinear Gaussian or Radial Basis kernel function. The proposed technique has been demonstrated by modelling the small signal behavior of a 4×100μm GaN HEMT over a broad frequency range of 1-18 GHz with multi-biasing sets and measured S-parameters. An extremely good agreement has been found between the measured and the modelled performance for the complete frequency range.