Abstract
Holographic interferometry allows visualizing SAW on the entire specimen surface simultaneously and measuring wave characteristics directly. A special method of SAW characteristics measurements by digital holographic interferometry was developed. The use of a picosecond laser allowed registering high frequency SAW two−exposure interferograms, and optical magnification of the CCD input image was used to increase spatial resolution.As a result we reach a sensitivity and resolution of visu-alization and SAW characteristics measurements that significantly exceeded the commonly known limitations of standard holographic methods.