Applying Neural Network for Extending Cavity Perturbation: Extraction of Complex Permittivity in Non-Linear Region

2023

Closed access Metadata (CSL-JSON)
DOI 10.1109/mapcon58678.2023.10464098
Data confidence 85 high
How this score is calculated

It is built from checkable properties of the record itself: whether the article has a DOI, how many independent sources confirmed its data, whether the required fields are filled in, and how recent the latest confirmation is. Disagreement between sources and a missing identifier lower it. A value of 80 or above means the record was published without further checking; 60 to 79 means it is published at reduced confidence, with a manual check advisable. A record verified by an editor by hand is never pushed below 90 by a recalculation. This scores our data about the article, not the article itself.

Abstract

To ensure precise modeling and simulation of microwave circuits and devices using CAD tools, it is essential to have a thorough knowledge of the dielectric properties of microwave substrates. However, in nonlinear regions, inaccurate characterization can occur as electromagnetic perturbation assumptions get invalid. The paper presents a novel neural network (NN) model, for accurately characterizing the dielectric materials’ properties under nonlinear region: the relative permittivity and loss tangent using a cylindrical cavity resonator operating in TM010mode. The proposed technique provides a complete characterization of the dielectric sample in both conventional (linear) and extended (non-linear) regions of the cavity perturbation. The NN model underwent training utilizing Levenberg Marquardt algorithm with a comprehensive dataset of approximately 4 million samples containing resonant frequency, quality factor, 3-dB bandwidth, insertion loss, reflection loss. This dataset was derived from the cylindrical cavity model, which incorporated diverse dielectric samples exhibiting varying relative permittivity and loss factor, all for a given sample thickness. Subsequently, the model underwent validation to assess its accuracy across a broad range of dielectric constants, loss tangent, and pragmatic thickness of the sample. The proposed model achieved an accuracy exceeding 99 %, underscoring its effectiveness in predicting the dielectric properties of different materials.