Abstract
This work presents a method for background removal and signal-to-noise ratio enhancement by an accumulation of signal and noise along analyzed spectrum. In this case, the signals are accumulated, and noise, due to its chaotic nature, is suppressed. The method is applied to analyze spectra obtained on DRON-6 diffractometer for study of the crystal structure of thin tin dioxide films produced by sol–gel technology and deposited on a glass substrate. The standard analysis of the crystallographic planes of the samples under study is practically impossible due to the high noise level and the negative influence of the background from the glass substrate. The proposed method transformed the initial spectrum, which cannot be analyzed, into an informative spectrum: the background signal from the substrate is correctly subtracted and the noise decreases by 10 times. To check for possible signal distortion due to accumulation signal along the spectrum, an analysis of simulated spectra was carried out. The onset of the transition of an amorphous state to a crystalline structure of SnO2 is investigated. The crystalline structure of SnO2 thin films depending on the annealing temperature is studied.