Abstract
Gadolinium oxotellurites GdMeTeO4.5 (Me – Mg, Ca) were synthesized using ceramic technology with solidphase interaction of oxides Gd2O3 and TeO2 with carbonates MgCO3 and CaCO3. X-ray characteristics were obtained using an Empyrean powder diffractometer and specialized programs Data Collector version 7.7h and X’Pert HighScore Plus using the Crystallography Open Database and PDF-2. Based on X-ray studies, it was established that the synthesized tellurites crystallize in a tetragonal syngony. The reliability and correctness of the indexing results is confirmed by the satisfactory agreement between the experimental and calculated parameters of the crystal lattice, unit cell volumes, X-ray and pycnometric densities. A study of the temperature dependence of the electrical resistance of gadolinium-magnesium tellurite has established that the compound may have semiconductor properties, with a band gap ∆E = 2.64 ± 0.13 ∙ 10–2 eV. The results can be used for the synthesis and study of new derivatives of tellurium and rare earth elements and are of interest for electronic technology. X-ray characteristics of new tellurites of s-, f-elements are the starting materials for inclusion in fundamental data banks and reference books.