Аннотация
Abstract An experimental setup has been created for scanning the integral light sum of X-ray luminescence IS = f(X) and X-ray luminescence spectrum IXRL = f(hν); the time dependence of integral tunnel luminescence ITL = f(τ) and its spectral composition TL = f(hν); the temperature dependence of integral thermally stimulated luminescence ITSL = f(T) and its spectral composition ITSL = f(hν); and the spectrum of “flash” IF = f(hν) and optical stimulation of “flash” IFOS = f(hν), irradiated with X-rays and uniaxially deformed along the crystallographic directions 〈100〉 or 〈110〉 at low temperature (85 K).