Аннотация
The rate of growth and the refractive indices of cryocondensates of water vapor deposited on mirror metal substrates in vacuum have been measured in the temperature interval 15–180 K. Reflection spectra of 0.25–2.5 μm thick layers deposited on these substrates have been measured in the wavelength region 2–20 μm. It is shown that the peculiarities in the condensation temperature dependences of the growth rate and refractive indices of the water vapor cryocondensates are consistent with the temperature ranges of existence of different solid phase structures obtained from the IR spectroscopy data. The effect of structural transitions in a cryocondensate layer on the shape of absorption bands is studied comprehensively in the region of 3 and 10–17 μm.