Аңдатпа
The study of atomically smooth surfaces of solids is of fundamental and practical interest in connection with the development of methods for the syn- thesis of nanostructures for electronics and photonics. Currently, there are several methods for producing surfaces with very low roughness, comparable to the interatomic distance. In this case, the question aris- es of the thickness of the surface layer of solids. Currently, for the most part, X-rays in the sliding incidence mode are used to identify the surface layers and determine their linear dimensions. In this paper, simple methods for the experimental determination of the size of the surface layers of metal compounds such as halides, sulfides, and oxides are proposed. The essence of the experiments was to study the dependence of the X-ray luminescence of these metal compounds on the grain size of the phosphor. Empirically, the size of the near-surface, in particular cases, layer was determined by the size of the atomic volume of the corresponding metal compound. In the proposed work, the surface layer is divided into two layers the layer h d (I) and the layer h10d (II). At h10d (II), the size dependence of the physical prop- erties of solids begins. For h d (I), a phase transition occurs in the surface layer. In pure metals, the thickness of the surface layer is much less than in their compounds. In some compounds, the thickness of the surface layer can reach micron values. At such layer sizes, a dimensional dependence of physical properties is still observed.